AEC-Q100 Qualified SD Cards: Here’s What Design Engineers Need to Know
AEC-Q100 is a failure mechanism-based stress test qualification created by the Automotive Electronics Council (AEC) for integrated circuits (IC). Qualified ICs are built to meet the intense reliability, quality and temperature demands of harsh environments. Specifications that must be met include a series of electrical, lifetime and reliability stress tests, as well as testing in various temperature ranges.
For a full list of specifications, visit the AEC website.
ICs originally endured testing to meet this standard for use in the automotive market. Recently, more and more industrial customers designing for applications used in other markets are choosing to design in qualified ICs due to the rigorous testing endured. With that said, if the goal is to create the most reliable application suitable for harsh environments regardless of the market, designing in Q100 components is a must.
SD cards, in particular, are a great example of an IC that should be AEC-Q100 qualified when designing for applications in any market - which has been an increasing trend amongst engineers. A worldwide leader in SD Cards, Panasonic, offers a variety of AEC-Q100 qualified SD cards that can operate in severe conditions and offer power failure robustness and program/erase endurance. Examples of these include RP-SDF02G (SLC 25nm), RP-SDPC16 (MLC 19nm) and eMMC, used in high performance applications.