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Electronic Materials
Circuit Board Materials
Felios Series
Felios Polyimide
Flexible Polyimide Circuit Board Materials Suitable for Wide Range of Applications
R-F775 (Double-Sided)
R-F770 (Single-Sided)
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Felios Polyimide
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2
Models table for series Felios Polyimide
Part No.
Datasheet
Tg (DSC) (°C)
Tg (TMA), (°C)
Tg (DMA) (°C)
Td (Thermal Decomposition) (°C)
T288 (Without Cu) (min)
T288 (With Cu) (min)
CTE-X,
CTE-Y
CTE-Z
CTE α2 Z-axis: Test Method IPC-TM-650 2.4.24; Condition A (ppm/℃)
Thermal Conductivity, (W/m・K)
Volume Resistivity (MΩ・cm)
Surface Resistivity (mΩ)
Dk at 1 GHz
Dk at 10 GHz
Dielectric Constant (Dk) @ 12Ghz; Test Method Balanced-type Circular Disk Resonator; Condition C-24/23/50
Df at 1 GHz
Df at 10 GHz
Df at 12 GHz
Water Absorption (%)
Flexural Warp (MD) (GPa)
Flexural Fill (TD) (GPa)
Peel Strength (1 Oz. Cu) (kN/m)
Flammability
Sample Thickness (mm)
R-F775
-
-
>340 (TPI 240)
577
-
-
18-20
16-19
-
-
0.16
-
-
3.2
3.2 Test method:Cavity resonance
3.1(19GHz)
0.002
0.004 Test method:Cavity resonance
0.003(19GHz)
0.9 Test method:Internal method
-
-
1.3(ED:18μm)
-
0.025mm
R-F770
-
-
>340 (TPI 240)
577
-
-
18-20
16-19
-
-
0.16
-
-
3.2
3.2 Test method:Cavity resonance
3.1(19GHz)
0.002
0.004 Test method:Cavity resonance
0.003(19GHz)
0.9 Test method:Internal method
-
-
1.3(ED:18μm)
-
0.025mm
Models table for series Felios Polyimide
Part No.
Datasheet
Tg (DSC) (°C)
Tg (TMA), (°C)
Tg (DMA) (°C)
Td (Thermal Decomposition) (°C)
T288 (Without Cu) (min)
T288 (With Cu) (min)
CTE-X,
CTE-Y
CTE-Z
CTE α2 Z-axis: Test Method IPC-TM-650 2.4.24; Condition A (ppm/℃)
Thermal Conductivity, (W/m・K)
Volume Resistivity (MΩ・cm)
Surface Resistivity (mΩ)
Dk at 1 GHz
Dk at 10 GHz
Dielectric Constant (Dk) @ 12Ghz; Test Method Balanced-type Circular Disk Resonator; Condition C-24/23/50
Df at 1 GHz
Df at 10 GHz
Df at 12 GHz
Water Absorption (%)
Flexural Warp (MD) (GPa)
Flexural Fill (TD) (GPa)
Peel Strength (1 Oz. Cu) (kN/m)
Flammability
Sample Thickness (mm)
R-F775
-
-
>340 (TPI 240)
577
-
-
18-20
16-19
-
-
0.16
-
-
3.2
3.2 Test method:Cavity resonance
3.1(19GHz)
0.002
0.004 Test method:Cavity resonance
0.003(19GHz)
0.9 Test method:Internal method
-
-
1.3(ED:18μm)
-
0.025mm
R-F770
-
-
>340 (TPI 240)
577
-
-
18-20
16-19
-
-
0.16
-
-
3.2
3.2 Test method:Cavity resonance
3.1(19GHz)
0.002
0.004 Test method:Cavity resonance
0.003(19GHz)
0.9 Test method:Internal method
-
-
1.3(ED:18μm)
-
0.025mm
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